KH7700

Quartz Crystals Temperature Test System
with PI - network Measurement

New State of the Art Features
True Multi-Tasking operation in Microsoft Windows® allows testing in background while generating reports and graphs by operator Test limits such as Temperature range and ppm can be changed after actual testing, this gives better reports and graphs presentation for customers Microsoft Windows® operation allows high quality graph printout User Programmable Drive Level : 10nW - 1 mW ( max and min power depends on Rr of crystal ) Crystal Measurement through passive p network techniques with KH 1120 / KH1240 network analyser Multiple crystal types may be accommodated in the same temperature run Automatic C0 cancellation for high frequencies User friendly system operation including menu driven, mouse operation and easy system calibration Perform pass/fail testing to user specified limits Stacked d ual row test wheel s can hold up to 508 crystals per chamber ( depends on crystal type ) Measures : Fs, FL, Rs, CL, C0, C1, L1, Q, Ts, C0/C1, DF, Fs/T, and FL/T Optional Chinese operating software
Frequency Range :	KH1120 : 1 - 120 MHz
	KH1240 : 1 - 240 MHz

Standard System Configuration
KH1120 or KH1240 Crystal PI Network Analyser KH7700 System Operating Software & System Cabling KM5900 Switch Box Work table KH7220 Chamber Dual Row p network test head and 4 inch cover (Optional : Stacked Dual Row PI Network Test Head and 8" cover) Dual row test wheel Legend and compatible computer, Windows® 98 Laser printer

Typical Report Format
Specification herein are preliminary, and are subject to change without prior notice. Photo shown is for reference only. Windows is a registered trademark of Microsoft Corp.